Yu, R, Jahdi, S, Mellor, P H, Yang, J, Shen, C, Liu, L, Alatise, O & Ortiz-Gonzalez, J 2022, Investigation of Repetitive Short Circuit Stress as a Degradation Metric in Symmetrical and Asymmetrical Double-Trench SiC Power MOSFETs . in 2022 IEEE Workshop on Wide Bandgap Power Devices and Applications in Europe (WiPDA Europe) . Institute of Electrical and Electronics Engineers (IEEE), Coventry, United Kingdom, 2022 IEEE Workshop on Wide Bandgap Power Devices and Applications in Europe (WiPDA Europe), 18/09/22 . https://doi.org/10.1109/WiPDAEurope55971.2022.9936284
Yang, J, Jahdi, S, Stark, B H, Shen, C, Alatise, O, Gonzalez, J O & Mellor, P H 2022, Positive and Negative Bias Temperature Instability on Crosstalk-Stressed Symmetrical & Asymmetrical Double-Trench SiC MOSFETs . in 2022 IEEE Energy Conversion Congress and Exposition, ECCE 2022 . 2022 IEEE Energy Conversion Congress and Exposition, ECCE 2022, Institute of Electrical and Electronics Engineers (IEEE), Detroit, MI, USA, 2022 IEEE Energy Conversion Congress and Exposition (ECCE), 9/10/22 . https://doi.org/10.1109/ECCE50734.2022.9948074
Shen, C, Jahdi, S, Yang, J, Alatise, O, Ortiz-Gonzalez, J & Mellor, P H 2022, Electrothermal Ruggedness of High Voltage SiC Merged-PiN-Schottky Diodes Under Inductive Avalanche & Surge Current Stress . in 2022 IEEE Energy Conversion Congress and Exposition, ECCE 2022 . 2022 IEEE Energy Conversion Congress and Exposition, ECCE 2022, Institute of Electrical and Electronics Engineers (IEEE), Detroit, MI, USA, 2022 IEEE Energy Conversion Congress and Exposition (ECCE), 9/10/22 . https://doi.org/10.1109/ECCE50734.2022.9948045