Scopus-Elsevier Symposium on Design, Test, Integration & Packaging of MEMS/MOEMS, DTIP 2009, pp. 313–316, Roma, 1-3 April 2009 info:cnr-pdr/source/autori:Marcelli R, Bartolucci G, Papaioannu G, De Angelis G, Lucibello A, Proietti E, Margesin B, Giacomozzi F, Deborgies F/congresso_nome:Symposium on Design, Test, Integration & Packaging of MEMS%2FMOEMS, DTIP 2009/congresso_luogo:Roma/congresso_data:1-3 April 2009/anno:2009/pagina_da:313/pagina_a:316/intervallo_pagine:313–316 Microsystem technologies 16 (2010): 1111–1118. doi:10.1007/s00542-009-1006-z info:cnr-pdr/source/autori:Marcelli R, Bartolucci G, Papaioannu G, De Angelis G, Lucibello A, Proietti E, Margesin B, Giacomozzi F, Deborgies F/titolo:Reliability of RF MEMS switches due to charging effects and their circuital modelling/doi:10.1007%2Fs00542-009-1006-z/rivista:Microsystem technologies/anno:2010/pagina_da:1111/pagina_a:1118/intervallo_pagine:1111–1118/volume:16