Edge-Coupled Active and Passive Wafer-Scale Measurements on 300mm Silicon Photonics Wafers
- Resource Type
- Conference
- Authors
- Jabon, Kenneth M.; Poulton, Christopher V.; Shiue, Ren-Jye; Byrd, Matthew J.; Su, Zhan; Teimourpour, Mohammad H.; Breitenstein, Scott; Millman, Ronald P.; Atlas, Dogan; Watts, Michael R.; Timurdogan, Erman
- Source
- 2021 Optical Fiber Communications Conference and Exhibition (OFC) Optical Fiber Communications Conference and Exhibition (OFC), 2021. :1-3 Jun, 2021
- Subject
- Communication, Networking and Broadcast Technologies
Photonics and Electrooptics
Integrated optics
Optical polarization
Couplers
Optical variables measurement
Silicon
Optical fiber communication
Optical reflection
(130.3120) Integrated optics devices
(250.5300) Photonic integrated circuits
(220.4840) Optical testing
- Language
We perform wafer-scale measurements of silicon photonics components using broadband (100nm+) edge couplers and reflecting optical fiber probes for the first time. We demonstrate