Rapid and Precise Displacement Measurement Using Time-of-Flight Detection of Femtosecond Optical Pulses
- Resource Type
- Conference
- Authors
- Na, Yongjin; Hyun, Minji; Jeon, Chan-Gi; Kim, Jungwon
- Source
- 2019 Conference on Lasers and Electro-Optics (CLEO) Lasers and Electro-Optics (CLEO), 2019 Conference on. :1-2 May, 2019
- Subject
- Photonics and Electrooptics
Optical pulses
Ultrafast optics
Displacement measurement
Image edge detection
Measurement by laser beam
Biomedical measurement
Semiconductor device measurement
- Language
We demonstrate high-speed and high-resolution displacement measurement method by utilizing electro-optic sampling between electrical pulses from photodetection and femtosecond optical pulses. A 5.8-nm (1.9-nm) resolution is achieved in only 50 μs (14 ms) update time. © 2019 The Author(s)