This paper presents the design and test of 2×2 channel emulator, which is especially optimized for LTE-Hi testing. It adopts traditional convention method of the channel impulse response in time domain. The design features lower memory resource with sharing delay data buffering, which could reduce the cost of efficient VLSI Implement. In addition, Bidirectional design offers flexible and reliable duplex separation. Finally, the initial test is performed in both time and frequency domain for performance validations.