The hysteresis curve of a ferroelectric capacitor describes the polarization reversal due to an alternating large signal excitation. In ideal ferroelectric capacitors the coercive voltage is independent of the frequency and the shape, triangular or sine, of the applied voltage signal, in the time regime, where the velocity of the domain walls has not to be considered. However, in real thin film capacitors the coercive voltage increases with increasing frequency. In this work the temperature dependence of this effect has been investigated using hysteresis, pulse, and small signal capacitance (C-V) measurements.