Effect of series resistance on degradation of isc, power output and fill factor of HIT technology
- Resource Type
- Conference
- Authors
- Singh, Rashmi; Bora, Birinchi; Yadav, Kamlesh; Sastry, O.S.; Kumar, Mithilesh; Kumar, Avinash; Renu; Bangar, Manander; Rai, Supriya; Kumar, Arun
- Source
- 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC) Photovoltaic Specialist Conference (PVSC), 2015 IEEE 42nd. :1-5 Jun, 2015
- Subject
- Aerospace
Components, Circuits, Devices and Systems
Engineered Materials, Dielectrics and Plasmas
Engineering Profession
Fields, Waves and Electromagnetics
Photonics and Electrooptics
Power, Energy and Industry Applications
Reliability
Photovoltaic cells
Current measurement
Irrigation
Indium phosphide
III-V semiconductor materials
degradation
irradiance
IEC 60891
series resistance
temperature
- Language
This paper presents the Dependency of Series Resistance over a wide range of Irradiance And Temperature for HIT Technology As Per IEC 61853-1. A quantitative assessment of the effect of series resistance on electrical performance parameters of HIT technology has been studied from long term outdoor performance data. Degradation of the performance of HIT technology after one year of outdoor exposure has been studied and observed that with the increase of Series resistance outdoor exposure fill factor, power and Isc decreases.