Using voltage-driven model to correlate GTEM cell and anechoic chamber measurement
- Resource Type
- Conference
- Authors
- Zhao, Bo; Zhao, Min; Chen, Daosheng
- Source
- 2012 IEEE International Instrumentation and Measurement Technology Conference Proceedings Instrumentation and Measurement Technology Conference (I2MTC), 2012 IEEE International. :2165-2168 May, 2012
- Subject
- Power, Energy and Industry Applications
Signal Processing and Analysis
TEM cells
Standards
Electromagnetic interference
Calibration
Anechoic chambers
Measurement uncertainty
Polynomials
Gigahertz Transverse Electromagnetic (GTEM) cell
Electromagnetic Interference (EMI)
Voltage-driven model
Error compensation
- Language
- ISSN
- 1091-5281
To improve the accuracy of the GTEM cell applied in radiated EMI measurement, an EMI noise extraction model and the error compensation method based on variance analysis are proposed. High moments were employed to compare the similarity of the two test curves between the GTEM cell after calibration and the standard test. The experimental results for a PCB using the voltage-driven model show that the accuracy of GTEM cell can be improved significantly and data are nearly consistent with the standard results using the suggested approach.