Signal Enhanced FTIR Analysis of Alignment in NAFION Thin Films at SiO
- Resource Type
- Authors
- Tawanda J, Zimudzi; Michael A, Hickner
- Source
- ACS macro letters. 5(1)
- Subject
- Language
- ISSN
- 2161-1653
Spin-cast NAFION samples were prepared on silicon native oxide and gold substrates with film thicknesses ranging from 5 to 250 nm. The influence of NAFION film thickness on the infrared spectrum of the polymer was investigated in substrate overlayer attenuated total reflection (SO-ATR) geometry at incident angles between 60° and 65°. In the grazing angle SO-ATR geometry, the thickness of the film significantly affected the position and absorbance of characteristic peaks in the FTIR spectrum of NAFION. Two major peaks in the NAFION spectrum at 1220 cm