Quantitative depth‐dependent analysis using the inelastic scattering backgrounds from X‐ray photoelectron spectroscopy and hard X‐ray photoelectron spectroscopy
- Resource Type
- Source
- Surface and Interface Analysis. 55:373-382
- Subject
Materials Chemistry Surfaces and Interfaces General Chemistry Condensed Matter Physics Surfaces, Coatings and Films - Language
- ISSN
- 1096-9918
0142-2421