Statistical characterization of PIXL trace element detection limits
- Resource Type
- Article
- Authors
- Christian, John R.; VanBommel, Scott J.; Elam, William T.; Ganly, Brianna; Hurowitz, Joel A.; Heirwegh, Christopher M.; Allwood, Abigail C.; Clark, Benton C.; Kizovski, Tanya V.; Knight, Abigail L.
- Source
- In Acta Astronautica November 2023 212:534-540
- Subject
- Language
- ISSN
- 0094-5765