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1 . Conference
Convolution-Based Vth Shift Prediction and the New 9T2C Pixel Circuit in LTPS TFT AMOLED
저자
by
Xia, Shiyu
;
Zhou, Longda
;
Wang, Kewei
;
Fan, Xiaobin
;
Xue, Yongkang
, et al.
소스
2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :1-7 Apr, 2024
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7 . Conference
Investigation of Positive Bias Temperature Instability in advanced FinFET nodes
저자
by
Xue, Yongkang
;
Yuan, Miaojia
;
Li, Yu
;
Wang, Da
;
Wu, Maokun
, et al.
소스
2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :1-5 Apr, 2024
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7 . Conference
Ultra-Fast Oxide Traps in Sub-20-nm DRAM Technology: from Characterization to Physical origin identification
저자
by
Wang, Da
;
Liu, Yong
;
Xue, Yongkang
;
Ren, Pengpeng
;
Sun, Zixuan
, et al.
소스
2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Electron Devices Technology & Manufacturing Conference (EDTM), 2024 8th IEEE. :1-3 Mar, 2024
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7 . Conference
New Insights into the Interface Trap Generation during Hot Carrier Degradation: Impacts of Full-band Electronic Resonance, (100) vs (110), and nMOS vs pMOS
저자
by
Wang, Zirui
;
Lu, Haoran
;
Sun, Zixuan
;
Shen, Cong
;
Peng, Baokang
, et al.
소스
2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023
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7 . Conference
Comprehensive Understanding of Flicker Noise in Advanced FinFET Technology: from Noise Sources Separation to Physical-based Modeling
저자
by
Wu, Junjie
;
Ren, Pengpeng
;
Zhang, Chenyang
;
Xiao, Yu
;
Xue, Yongkang
, et al.
소스
2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023
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7 . Conference
Comprehensive Study of NBTI and Off-State Reliabilty in Sub-20 nm DRAM Technology: Trap Identification, Compact Aging Model, and Impact on Retention Degradation
저자
by
Sun, Zixuan
;
Cai, Puyang
;
Song, Jiahao
;
Wang, Da
;
Liu, Zhuyou
, et al.
소스
2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023
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7 . Conference
A New Method of Automatic Extraction of RTN and OMI-Friendly Implementation
저자
by
Xiao, Yu
;
Zhang, Chenyang
;
Wang, Da
;
Xue, Yongkang
;
Ren, Pengpeng
, et al.
소스
2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :P75.TX-1-P75.TX-4 Apr, 2024
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7 . Conference
Investigation of Interplays between Body Biasing and Hot Carrier Degradation (HCD) in Advanced NMOS FinFETs
저자
by
Sun, Zixuan
;
Xue, Yongkang
;
Lu, Haoran
;
Ren, Pengpeng
;
Wang, Zirui
, et al.
소스
2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :P72.TX-1-P72.TX-5 Apr, 2024
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7 . Conference
Sub-20-nm DRAM Technology under Negative Bias Temperature Instability (NBTI): from Characterization to Physical Origin Identification
저자
by
Wang, Da
;
Xue, Yongkang
;
Liu, Yong
;
Ren, Pengpeng
;
Sun, Zixuan
, et al.
소스
2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :9B.2-1-9B.2-7 Apr, 2024
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7 . Academic Journal
Positive effects of vegetation restoration on the soil properties of post-mining land
저자
by
Li, Cuihuan
;
Ji, Yongkang
;
Ma, Nan
;
Zhang, Jing
;
Zhang, Hui
, et al.
소스
Plant and Soil: An International Journal on Plant-Soil Relationships
. 497(1-2):93-103
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