2001 6th international symposium on plasma- & process-induced damage (ieee cat. no.01th8538) (1)
2001 6th international symposium on plasma- and process-induced damage (ieee cat. no.01th8538), plasma- and process-induced damage, 2001 6th international symposium on, plasma- and process-induced damage (1)
2003 5th international conference on asic. proceedings (ieee cat. no.03th8690) (1)
2003 8th international symposium plasma- & process-induced damage (1)
2003 8th international symposium plasma- and process-induced damage., plasma- and process-induced damage, 2003 8th international symposium, plasma- and process-induced damage (1)
2005 ieee international reliability physics symposium, 2005. proceedings 43rd annual (1)
2005 ieee international reliability physics symposium, 2005. proceedings. 43rd annual., reliability physics symposium, 2005. proceedings. 43rd annual. 2005 ieee international, reliability physics (1)
32nd european solid-state device research conference (1)
32nd european solid-state device research conference, solid-state device research conference, 2002. proceeding of the 32nd european (1)
essderc '03. 33rd conference on european solid-state device research, 2003 (1)
essderc '03. 33rd conference on european solid-state device research, 2003., european solid-state device research, 2003. essderc '03. 33rd conference on, solid-state device research - essderc '03 (1)
ieee international integrated reliability workshop final report, 2002 (1)
ieee international integrated reliability workshop final report, 2002., integrated reliability workshop final report, 2002. ieee international, integrated reliability (1)
ieee transactions on electron devices, electron devices, ieee transactions on, ieee trans. electron devices (1)
microelectronic engineering (1)