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1 . Conference
Consideration on the extrapolation of the low insulator field TDDB in 4H-SiC power MOSFETs
저자
by
Fiorenza, P.
;
Cordiano, F.
;
Alessandrino, S. M.
;
Russo, A.
;
Zanetti, E.
, et al.
소스
2023 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2023 IEEE International. :1-4 Mar, 2023
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7 . Conference
Correlation between MOSFETs breakdown and 4H-SiC epitaxial defects
저자
by
Fiorenza, P.
;
Adamo, S.
;
Alessandrino, M. S.
;
Bottari, C.
;
Carbone, B.
, et al.
소스
2021 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2021 IEEE International. :1-6 Mar, 2021
Full Text (IEEE)
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7 . Conference
Effect of interface and bulk charges on the breakdown of nitrided gate oxide on 4H-SiC
저자
by
Mazza, B.
;
Patane, S.
;
Cordiano, F.
;
Giliberto, M.
;
Renna, G.
, et al.
소스
2021 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2021 IEEE International. :1-4 Mar, 2021
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7 . Academic Journal
Characterization and modeling of CMOS-compatible acoustical particle velocity sensors for applications requiring low supply voltages
저자
by
Piotto, M.
;
Butti, F.
;
Zanetti, E.
;
Di Pancrazio, A.
;
Iannaccone, G.
, et al.
소스
In
Sensors & Actuators: A. Physical
15 June 2015 229:192-202
Full Text (ScienceDirect)
Web of Science
Scopus
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7 . Report
Nanoscale insights on the origin of the Power MOSFETs breakdown after extremely long high temperature reverse bias stress
저자
by
Fiorenza, P.
;
Alessandrino, M.
;
Carbone, B.
;
Di Martino, C.
;
Russo, A.
, et al.
소스
Materials Science Forum 1004, (2020) 433-438
Open Access (Arxiv)
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7 . Report
Understanding the role of threading dislocations on 4H-SiC MOSFET breakdown under high temperature reverse bias stress
저자
by
Fiorenza, P.
;
Alessandrino, M.
;
Carbone, B.
;
Di Martino, C.
;
Russo, A.
, et al.
소스
Nanotechnology 31, (2020) 125203
Open Access (Arxiv)
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7 . Conference
Thermal Model Development for SiC MOSFETs Robustness Analysis under Repetitive Short Circuit Tests
저자
by
Pulvirenti, M.
;
Cavallaro, D.
;
Bentivegna, N.
;
Cascino, S.
;
Zanetti, E.
, et al.
소스
2020 22nd European Conference on Power Electronics and Applications (EPE'20 ECCE Europe) Power Electronics and Applications (EPE'20 ECCE Europe), 2020 22nd European Conference on. :P.1-P.10 Sep, 2020
Full Text (IEEE)
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7 . Academic Journal
Temperature dependence of the c-axis drift mobility in 4H–SiC
저자
by
Galvagno, G.
;
Roccaforte, F.
;
Ruggiero, A.
;
Calcagno, L.
;
Zanetti, E.
, et al.
소스
In
Microelectronic Engineering
2006 83(1):45-47
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7 . Academic Journal
EP16.03-042 BET Inhibitors Stimulate NK Cytotoxic Activity in NSCLC through Attenuation of YAP/TAZ and SMAD3 Transcriptional Programs
저자
by
Reggiani, F.
;
Orecchioni, S.
;
Sauta, E.
;
Torricelli, F.
;
Talarico, G.
, et al.
소스
In
Journal of Thoracic Oncology
September 2022 17(9) Supplement:S608-S608
Full Text (ScienceDirect)
Full Text (ScienceDirect O/A)
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7 . Academic Journal
THE TREATMENT OF PRESSURE ULCERS WITH BACTERIA BINDING MEDICATION AS A VALID THERAPEUTIC OPPORTUNITY.
저자
by
Ambrosini, S.
;
Zanetti, E.
;
Guarneri, F.
;
Lazzari, C.
;
Restivo, I.
, et al.
소스
European Journal of Hospital Pharmacy; 2024 Supplement, Vol. 31, pA221-A221, 1/2p
Web of Science
Scopus
JCR 저널정보
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