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1 . Conference
6.10 A 1/1.56-inch 50Mpixel CMOS Image Sensor with 0.5μm pitch Quad Photodiode Separated by Front Deep Trench Isolation
저자
by
Kim, DongHyun
;
Cho, Kwansik
;
Ji, Ho-Chul
;
Kim, Minkyung
;
Kim, Junghye
, et al.
소스
2024 IEEE International Solid-State Circuits Conference (ISSCC) Solid-State Circuits Conference (ISSCC), 2024 IEEE International. 67:118-120 Feb, 2024
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7 . Conference
3-STAR: A Super-steep switching, Stackable, and Strongly Reliable Transistor Array RAM for Sub-10nm DRAM and beyond
저자
by
Lee, Kynghwan
;
Yoo, Sungwon
;
Hong, Jaeho
;
Kim, Hyun-Cheol
;
Kim, YongSeok
, et al.
소스
2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023
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7 . Conference
Fundamental Issues in VNAND Integration Toward More Than 1K Layers
저자
by
Han, Jeehoon
;
Kang, Seogoo
;
Kim, Kyungdong
;
Jang, Jaehoon
;
Song, Jaihyuk
.
소스
2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-5 Dec, 2023
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7 . Conference
Highly Manufacturable, Cost-Effective, and Monolithically Stackable 4F2 Single-Gated IGZO Vertical Channel Transistor (VCT) for sub-10nm DRAM
저자
by
Ha, Daewon
;
Lee, Wonsok
;
Cho, M.H.
;
Terai, M.
;
Yoo, S.-W.
, et al.
소스
2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023
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7 . Conference
A 0.5µm Pixel 3-layer Stacked CMOS Image Sensor with Deep Contact and In-pixel Cu-Cu Bonding Technology
저자
by
Lee, Gwi-Deok Ryan
;
Kim, Dae-Hoon
;
Kwon, Doowon
;
Park, Jong-Eun
;
Cho, Dongseok
, et al.
소스
2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023
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7 . Conference
First demonstration of 3-dimensional stacked FET with top/bottom source-drain isolation and stacked n/p metal gate
저자
by
Park, Jaehyun
;
Kim, Wukang
;
Park, Sungil
;
Yun, Jinchan
;
Hwang, Kyuman
, et al.
소스
2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023
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7 . Conference
Comprehensive Design Guidelines of Gate Stack for QLC and Highly Reliable Ferroelectric VNAND
저자
by
Lim, Suhwan
;
Kim, Taeyoung
;
Myeong, Ilho
;
Park, Sanghyun
;
Noh, Suseong
, et al.
소스
2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023
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7 . Conference
A Comprehensive Study of Read-After-Write-Delay for Ferroelectric VNAND
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by
Myeong, Ilho
;
Lim, Suhwan
;
Kim, Taeyoung
;
Park, Sanghyun
;
Noh, Suseong
, et al.
소스
2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :9B.3-1-9B.3-6 Apr, 2024
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7 . Conference
A Novel Quantitative Model for Combination Effects of Hydrogen and Process Heat on Peripheral Transistors in 3D-NAND Flash Memory
저자
by
Lee, Dongjin
;
Lee, Yunjo
;
Na, Soyeong
;
Yun, KangOh
;
Baek, Sungkweon
, et al.
소스
2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :P68.TX-1-P68.TX-5 Apr, 2024
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7 . Conference
Drain Current Degradation Induced by Charge Trapping/De-Trapping in Fe-FET
저자
by
Kim, Taeyoung
;
Lim, Suhwan
;
Myeong, Ilho
;
Park, Sanghyun
;
Noh, Suseong
, et al.
소스
2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :P6.EM-1-P6.EM-4 Apr, 2024
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