journal of electronic testing (8)
2018 ieee 36th vlsi test symposium (vts), vlsi test symposium (vts), 2018 ieee 36th (5)
journal of electronic testing: theory and applications (4)
journal of electronic testing-theory and applications (4)
2017 ieee international test conference (itc), test conference (itc), 2017 ieee international (3)
2016 ieee international test conference (itc), test conference (itc), 2016 ieee international (2)
ee: evaluation engineering (2)
2013 22nd asian test symposium (1)
2013 22nd asian test symposium, test symposium (ats), 2013 22nd asian (1)
2014 9th international design & test symposium (idt) (1)
2014 9th international design and test symposium (idt), design & test symposium (idt), 2014 9th international (1)
2015 ieee 20th international mixed-signals testing workshop (imstw) (1)
2015 ieee 20th international mixed-signals testing workshop (imstw), mixed-signal testing workshop (imstw), 2015 20th international (1)
2016 17th international symposium on quality electronic design (isqed) (1)
2016 17th international symposium on quality electronic design (isqed), quality electronic design (isqed), 2016 17th international symposium on (1)
2016 21th ieee european test symposium (ets) (1)
2016 21th ieee european test symposium (ets), test symposium (ets), 2016 21th ieee european (1)
2016 ieee 21st international mixed-signal testing workshop (imstw) (1)
2016 ieee 34th vlsi test symposium (vts) (1)
2016 ieee 34th vlsi test symposium (vts), vlsi test symposium (vts), 2016 ieee 34th (1)
2017 ieee 35th vlsi test symposium (vts), vlsi test symposium (vts), 2017 ieee 35th (1)
2017 ieee east-west design & test symposium (ewdts), east-west design & test symposium (ewdts), 2017 ieee (1)
2019 ieee 25th international symposium on on-line testing and robust system design (iolts), on-line testing and robust system design (iolts ), 2019 ieee 25th international symposium on (1)
2019 ieee 37th vlsi test symposium (vts), vlsi test symposium (vts), 2019 ieee 37th (1)
ieee transactions on device & materials reliability (1)
ieee transactions on device and materials reliability (1)