ieee transactions on nuclear science (22)
proceedings of the conference: design, automation & test in europe (12)
journal of electronic testing: theory and applications (11)
journal of electronic testing-theory and applications (7)
journal of electronic testing (5)
microelectronics reliability (4)
13th ieee international on-line testing symposium (iolts 2007), on-line testing symposium, 2007. iolts 07. 13th ieee international (3)
2013 8th ieee design and test symposium, design and test symposium (idt), 2013 8th international (3)
2014 ieee 20th international on-line testing symposium (iolts), on-line testing symposium (iolts), 2014 ieee 20th international (3)
journal of electronic testing: theory & applications (3)
2010 15th ieee european test symposium, test symposium (ets), 2010 15th ieee european (2)
2010 ieee 16th international on-line testing symposium, on-line testing symposium (iolts), 2010 ieee 16th international (2)
2010 ieee international test conference, test conference (itc), 2010 ieee international (2)
2011 ieee international symposium on defect and fault tolerance in vlsi and nanotechnology systems, defect and fault tolerance in vlsi and nanotechnology systems (dft), 2011 ieee international symposium on (2)
2011 sixteenth ieee european test symposium, test symposium (ets), 2011 16th ieee european (2)
2012 ieee international symposium on defect and fault tolerance in vlsi and nanotechnology systems (dft), defect and fault tolerance in vlsi and nanotechnology systems (dft), 2012 ieee international symposium on (2)
2013 ieee 19th international on-line testing symposium (iolts), on-line testing symposium (iolts), 2013 ieee 19th international (2)
2015 10th international conference on design & technology of integrated systems in nanoscale era (dtis), design & technology of integrated systems in nanoscale era (dtis), 2015 10th international conference on (2)
2015 conference on design of circuits and integrated systems (dcis), design of circuits and integrated systems (dcis), 2015 conference on (2)
2015 ieee 21st international on-line testing symposium (iolts), on-line testing symposium (iolts), 2015 ieee 21st international (2)
2016 21th ieee european test symposium (ets), test symposium (ets), 2016 21th ieee european (2)
2016 ieee 19th international symposium on design and diagnostics of electronic circuits & systems (ddecs), design and diagnostics of electronic circuits & systems (ddecs), 2016 ieee 19th international symposium on (2)
2017 18th ieee latin american test symposium (lats), test symposium (lats), 2017 18th ieee latin american (2)
2019 ieee 22nd international symposium on design and diagnostics of electronic circuits & systems (ddecs), design and diagnostics of electronic circuits & systems (ddecs), 2019 ieee 22nd international symposium on (2)
2022 ieee european test symposium (ets), test symposium (ets), 2022 ieee european (2)
2023 ieee international symposium on defect and fault tolerance in vlsi and nanotechnology systems (dft), defect and fault tolerance in vlsi and nanotechnology systems (dft), 2023 ieee international symposium on (2)
2024 27th international symposium on design & diagnostics of electronic circuits & systems (ddecs), design & diagnostics of electronic circuits & systems (ddecs), 2024 27th international symposium on (2)
22nd ieee international symposium on defect and fault-tolerance in vlsi systems (dft 2007), defect and fault-tolerance in vlsi systems, 2007. dft '07. 22nd ieee international symposium on (2)
13th ieee symposium on design and diagnostics of electronic circuits and systems, design and diagnostics of electronic circuits and systems (ddecs), 2010 ieee 13th international symposium on (1)
14th ieee international symposium on design and diagnostics of electronic circuits and systems, design and diagnostics of electronic circuits & systems (ddecs), 2011 ieee 14th international symposium on (1)
2005 18th symposium on integrated circuits and systems design, integrated circuits and systems design, 18th symposium on (1)
2007 design, automation & test in europe conference & exhibition, design, automation & test in europe conference & exhibition, 2007. date '07 (1)
2007 eighth international workshop on microprocessor test and verification, microprocessor test and verification, 2007. mtv '07. eighth international workshop on (1)
2007 ieee design and diagnostics of electronic circuits and systems, design and diagnostics of electronic circuits and systems, 2007. ddecs '07. ieee (1)
2008 11th ieee workshop on design and diagnostics of electronic circuits and systems, design and diagnostics of electronic circuits and systems, 2008. ddecs 2008. 11th ieee workshop on (1)
2008 14th ieee international on-line testing symposium, on-line testing symposium, 2008. iolts '08. 14th ieee international (1)
2008 design, automation and test in europe, design, automation and test in europe, 2008. date '08 (1)
2008 ieee international test conference, test conference, 2008. itc 2008. ieee international (1)
2008 ninth international workshop on microprocessor test and verification, microprocessor test and verification, 2008. mtv '08. ninth international workshop on (1)
2009 12th international symposium on design and diagnostics of electronic circuits & systems, design and diagnostics of electronic circuits & systems, 2009. ddecs '09. 12th international symposium on (1)
2009 14th ieee european test symposium, test symposium, 2009 14th ieee european (1)
2009 27th ieee vlsi test symposium, vlsi test symposium, 2009. vts '09. 27th ieee (1)
2009 asian test symposium, asian test symposium, 2009. ats '09. (1)
2010 11th international workshop on microprocessor test and verification, microprocessor test and verification (mtv), 2010 11th international workshop on (1)
2010 11th latin american test workshop, test workshop (latw), 2010 11th latin american (1)
2010 ieee international symposium on circuits and systems (iscas), circuits and systems (iscas), 2010 ieee international symposium on (1)
acm transactions on design automation of electronic systems (1)
design, automation & test in europe (1)
parallel computing (1)
radiation effects on embedded systems (1)