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1 . Academic Journal
Random Telegraph Noise and Radiation Response of 80 nm Vertical Charge-Trapping NAND Flash Memory Devices With SiON Tunneling Oxide
저자
by
Wynocker, I.R.
;
Xia Zhang, E.
;
Reed, R.A.
;
Schrimpf, R.D.
;
Arreghini, A.
, et al.
소스
IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 71(8):1789-1797 Aug, 2024
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7 . Academic Journal
Total-Ionizing-Dose Effects in IGZO Thin-Film Transistors With SiO₂ Oxygen-Penetration Layers
저자
by
Guo, Z.
;
Zhang, E.X.
;
Chasin, A.
;
Linten, D.
;
Belmonte, A.
, et al.
소스
IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 71(4):461-468 Apr, 2024
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7 . Conference
Gate oxide reliability: upcoming trends, challenges, and opportunities
저자
by
Kaczer, B.
;
Degraeve, R.
;
Franco, J.
;
Grasser, T.
;
Roussel, Ph. J.
, et al.
소스
2024 IEEE Silicon Nanoelectronics Workshop (SNW) Silicon Nanoelectronics Workshop (SNW), 2024 IEEE. :3-4 Jun, 2024
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7 . Academic Journal
Detailed low frequency noise assessment on GAA NW n-channel FETs
저자
by
Cretu, B.
;
Bordin, A.
;
Simoen, E.
;
Hellings, G.
;
Linten, D.
, et al.
소스
In
Solid State Electronics
August 2021 181-182
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7 . Academic Journal
The impact of self-heating and its implications on hot-carrier degradation – A modeling study
저자
by
Tyaginov, S.
;
Makarov, A.
;
Chasin, A.
;
Bury, E.
;
Vandemaele, M.
, et al.
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In
Microelectronics Reliability
July 2021 122
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7 . Academic Journal
Fault Attack Investigation on TaOx Resistive-RAM for Cyber Secure Application
저자
by
Kumar, A.
;
Degraeve, R.
;
Beckers, A.
;
Fantini, A.
;
Verbauwhede, I.
, et al.
소스
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 70(8):4170-4177 Aug, 2023
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7 . Academic Journal
Total-Ionizing-Dose Effects in IGZO Thin-Film Transistors
저자
by
Guo, Z.
;
Li, K.
;
Li, X.
;
Luo, X.
;
Zhang, E.X.
, et al.
소스
IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 70(8):2002-2007 Aug, 2023
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7 . Conference
Reliability challenges in Forksheet Devices: (Invited Paper)
저자
by
Bury, E.
;
Vandemaele, M.
;
Franco, J.
;
Chasin, A.
;
Tyaginov, S.
, et al.
소스
2023 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2023 IEEE International. :1-8 Mar, 2023
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7 . Academic Journal
Low frequency noise analysis on Si/SiGe superlattice I/O n-channel FinFETs
저자
by
Boudier, D.
;
Cretu, B.
;
Simoen, E.
;
Hellings, G.
;
Schram, T.
, et al.
소스
In
Solid State Electronics
June 2020 168
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7 . Academic Journal
Effects of Geometry and Cycling on the Radiation Response of Charge-Trapping NAND Memory Devices With SiON Tunneling Oxide
저자
by
Cao, J.
;
Wynocker, I.
;
Zhang, E.X.
;
Reed, R.A.
;
Alles, M.L.
, et al.
소스
IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 70(4):634-640 Apr, 2023
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