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1 . Conference
Development of thermal neutron SER-resilient high-k/metal gate technology
저자
by
Park, Jongwoo
;
Gunrae Kim
;
Ming Zhang
;
Kyungsik Park
;
Miji Lee
, et al.
소스
2014 IEEE International Reliability Physics Symposium Reliability Physics Symposium, 2014 IEEE International. :2B.4.1-2B.4.3 Jun, 2014
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7 .
Soft-Error Susceptibility in Flip-Flop in EUV 7 nm Bulk-FinFET Technology
저자
by
Jaehee Choi
;
Seungbae Lee
;
Mijoung Kim
;
Brandon Lee
;
Jeongmin Jo
, et al.
소스
IRPS
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7 . Conference
Mature processability and manufacturability by characterizing VT and Vmin behaviors induced by NBTI and AHTOL test.
저자
by
Jongwoo Park
;
Sungmok Ha
;
Sunme Lim
;
Jae-Yoon Yoo
;
Junkyun Park
, et al.
소스
2010 IEEE International Reliability Physics Symposium (IRPS); 2010, p104-110, 7p
Full Text (IEEE)
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7 .
Investigation of BTI characteristics and its behavior on 10 nm SRAM with high-k/metal gate FinFET technology having multi-VT gate stack
저자
by
Kangjung Kim
;
Gunrae Kim
;
Yoohwan Kim
;
Hyewon Shim
;
Sangwoo Pae
, et al.
소스
Microelectronics Reliability
. 81:201-209
Web of Science
Scopus
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7 .
Characterization of plate-like Ni-Sn intermetallic compounds in Sn-Ag solder bump
저자
by
Sangsu Ha
;
Sangkwon Park
;
Miji Lee
;
Gunrae Kim
;
Sang-chul Shin
, et al.
소스
2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
.
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7 .
New insights into 10nm FinFET BTI and its variation considering the local layout effects
저자
by
Taiki Uemura
;
Jungin Kim
;
Jinju Kim
;
Hyun Chul Sagong
;
Gunrae Kim
, et al.
소스
2017 IEEE International Reliability Physics Symposium (IRPS)
.
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7 .
Investigation of logic soft error and scaling effect in 10 nm FinFET technology
저자
by
Gunrae Kim
;
Soonyoung Lee
;
Sangwoo Pae
;
Taiki Uemura
.
소스
2017 IEEE International Reliability Physics Symposium (IRPS)
.
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6 .
Novel Error Detection Scheme With the Harmonious Use of Parity Codes, Well-Taps, and Interleaving Distance
저자
by
Il-gon Kim
;
Gunrae Kim
;
Sanghyeon Baeg
;
Sang Hoon Jeon
;
Soonyoung Lee
.
소스
IEEE Transactions on Nuclear Science
. 61:2711-2717
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7 .
Reliability characterization of 10nm FinFET technology with multi-VT gate stack for low power and high performance
저자
by
Junekyun Park
;
Taiki Uemura
;
Taehyun An
;
Soonyoung Lee
;
Sangwoo Pae
, et al.
소스
2016 IEEE International Electron Devices Meeting (IEDM)
.
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7 .
Propensity of Copper Dendrite Growth on Subassembly Package Components Used in Quad Flat Package
저자
by
Gunrae Kim
;
Jongwoo Park
;
Yong-Bum Jo
;
Junekyun Park
.
소스
IEEE Transactions on Device and Materials Reliability
. 8:368-374
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