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1 . Academic Journal
Extending Electrostatic Modeling for Schottky p-GaN Gate HEMTs: Uniform and Engineered p-GaN Doping
저자
by
Alaei, M.
;
Borga, M.
;
Fabris, E.
;
Decoutere, S.
;
Lauwaert, J.
, et al.
소스
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(10):5949-5955 Oct, 2024
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7 . Academic Journal
Modeling Gate Leakage Current for p-GaN Gate HEMTs With Engineered Doping Profile
저자
by
Alaei, M.
;
Borga, M.
;
Fabris, E.
;
Decoutere, S.
;
Lauwaert, J.
, et al.
소스
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(8):4563-4569 Aug, 2024
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7 . Academic Journal
1.2 kV Enhancement-Mode p-GaN Gate HEMTs on 200 mm Engineered Substrates
저자
by
Kumar, S.
;
Geens, K.
;
Vohra, A.
;
Wellekens, D.
;
Cingu, D.
, et al.
소스
IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 45(4):657-660 Apr, 2024
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7 . Academic Journal
Degradation of GaN-on-GaN vertical diodes submitted to high current stress
저자
by
Fabris, E.
;
Meneghini, M.
;
De Santi, C.
;
Hu, Z.
;
Li, W.
, et al.
소스
In
Microelectronics Reliability
September 2018 88-90:568-571
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7 . Academic Journal
Performance of Prognostic Risk Scores in Chronic Heart Failure Patients Enrolled in the European Society of Cardiology Heart Failure Long-Term Registry
저자
by
Crespo-Leiro, M.
;
Anker, S.
;
Mebazaa, A.
;
Coats, A.
;
Filippatos, G.
, et al.
소스
In
JACC: Heart Failure
June 2018 6(6):452-462
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7 . Conference
Vertical stack reliability of GaN-on-Si buffers for low-voltage applications
저자
by
Fabris, E.
;
Borga, M.
;
Posthuma, N.
;
Zhao, M.
;
De Jaeger, B.
, et al.
소스
2021 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2021 IEEE International. :1-8 Mar, 2021
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7 . Conference
Hot-Electron Effects in GaN GITs and HD-GITs: A Comprehensive Analysis
저자
by
Fabris, E.
;
Meneghini, M.
;
De Santi, C.
;
Borga, M.
;
Meneghesso, G.
, et al.
소스
2019 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2019 IEEE International. :1-6 Mar, 2019
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7 . Academic Journal
Impact of Residual Carbon on Avalanche Voltage and Stability of Polarization-Induced Vertical GaN p-n Junction
저자
by
Fabris, E.
;
De Santi, C.
;
Caria, A.
;
Mukherjee, K.
;
Nomoto, K.
, et al.
소스
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 67(10):3978-3982 Oct, 2020
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7 . Academic Journal
Trapping and Detrapping Mechanisms in β-Ga₂O₃ Vertical FinFETs Investigated by Electro-Optical Measurements
저자
by
Fabris, E.
;
De Santi, C.
;
Caria, A.
;
Li, W.
;
Nomoto, K.
, et al.
소스
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 67(10):3954-3959 Oct, 2020
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7 . Academic Journal
GaN Vertical p–i–n Diodes in Avalanche Regime: Time-Dependent Behavior and Degradation
저자
by
De Santi, C.
;
Fabris, E.
;
Meneghesso, G.
;
Zanoni, E.
;
Meneghini, M.
.
소스
IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 41(9):1300-1303 Sep, 2020
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