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1 . Academic Journal
Array Architectures for 3-D NAND Flash Memories
저자
by
Micheloni, R.
;
Aritome, S.
;
Crippa, L.
.
소스
Proceedings of the IEEE Proc. IEEE Proceedings of the IEEE. 105(9):1634-1649 Sep, 2017
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5 . Academic Journal
Compact Modeling of Negative $V_{t}$ Shift Disturb in NAND Flash Memories
저자
by
Zambelli, C.
;
Andrian, F.
;
Aritome, S.
;
Olivo, P.
.
소스
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 63(4):1516-1523 Apr, 2016
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6 . Academic Journal
Advanced DC-SF Cell Technology for 3-D NAND Flash
저자
by
Aritome, S.
;
Noh, Y.
;
Yoo, H.
;
Choi, E. S.
;
Joo, H. S.
, et al.
소스
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 60(4):1327-1333 Apr, 2013
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7 . Academic Journal
NAND Flash Innovations
저자
by
Aritome, S.
.
소스
IEEE Solid-State Circuits Magazine IEEE Solid-State Circuits Mag. Solid-State Circuits Magazine, IEEE. 5(4):21-29 Jan, 2013
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3 . Academic Journal
Novel Negative $Vt$ Shift Phenomenon of Program–Inhibit Cell in $\hbox{2}X{-}\hbox{3}X\hbox{-}\hbox{nm}$ Self-Aligned STI nand Flash Memory
저자
by
Aritome, S.
;
Seo, S.
;
Kim, H.-S.
;
Park, S.-K.
;
Lee, S.-K.
, et al.
소스
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 59(11):2950-2955 Nov, 2012
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7 . Conference
Advanced flash memory technology and trends for file storage application
저자
by
Aritome, S.
.
소스
International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) Electron devices meeting Electron Devices Meeting, 2000. IEDM '00. Technical Digest. International. :763-766 2000
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3 . Conference
A novel surface-oxidized barrier-SiN cell technology to improve endurance and read-disturb characteristics for gigabit NAND flash memories
저자
by
Goda, A.
;
Moriyama, W.
;
Hazama, H.
;
Iizuka, H.
;
Shimizu, K.
, et al.
소스
International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) Electron devices meeting Electron Devices Meeting, 2000. IEDM '00. Technical Digest. International. :771-774 2000
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7 . Conference
A novel gate-offset NAND cell (GOC-NAND) technology suitable for high-density and low-voltage-operation flash memories
저자
by
Satoh, S.
;
Nakamura, T.
;
Shimizu, K.
;
Takeuchi, K.
;
Iizuka, H.
, et al.
소스
International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318) Electron devices Electron Devices Meeting, 1999. IEDM '99. Technical Digest. International. :271-274 1999
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7 . Conference
Anomalous diffusion of dopant in Si substrate during oxynitride process
저자
by
Yaegashi, T.
;
Aoki, N.
;
Takeuchi, Y.
;
Hazama, H.
;
Aritome, S.
, et al.
소스
International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318) Electron devices Electron Devices Meeting, 1999. IEDM '99. Technical Digest. International. :341-344 1999
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7 . Academic Journal
Improvement of Interpoly Dielectric Characteristics by Plasma Nitridation and Oxidation for Future nand Flash Memory
저자
by
Ho, C. Y.
;
Lien, C.
;
Sakamoto, Y.
;
Yang, R. J.
;
Fijita, H.
, et al.
소스
IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 29(11):1199-1202 Nov, 2008
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