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1 . Conference
28nm Data Memory with Embedded RRAM Technology in Automotive Microcontrollers
저자
by
Grossi, Alessandro
;
Coppetta, Matteo
;
Aresu, Stefano
;
Kux, Andreas
;
Kern, Thomas
, et al.
소스
2023 IEEE International Memory Workshop (IMW) Memory Workshop (IMW), 2023 IEEE International. :1-4 May, 2023
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7 . Conference
Relevance of off-state NBTI degradation in depletion HVNMOS transistor for power application
저자
by
Strasser, Marc
;
Stradiotto, Roberta
;
Aresu, Stefano
;
Puschkarsky, Katja
;
Poehle, Holger
, et al.
소스
2018 International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2018 International. :1-4 Oct, 2018
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7 . Conference
On the PBTI degradation of pMOSFETs and its impact on IC lifetime
저자
by
Schlunder, Christian
;
Reisinger, Hans
;
Aresu, Stefano
;
Gustin, Wolfgang
.
소스
2011 IEEE International Integrated Reliability Workshop Final Report Integrated Reliability Workshop Final Report (IRW), 2011 IEEE International. :7-11 Oct, 2011
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6 . Conference
Automotive 130 nm smart-power-technology including embedded flash functionality
저자
by
Rudolf, Ralf
;
Wagner, Cajetan
;
O'Riain, Lincoln
;
Gebhardt, Karl-Heinz
;
Kuhn-Heinrich, Barbara
, et al.
소스
2011 IEEE 23rd International Symposium on Power Semiconductor Devices and ICs Power Semiconductor Devices and ICs (ISPSD), 2011 IEEE 23rd International Symposium on. :20-23 May, 2011
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7 . Conference
Hot-carrier induced dielectric breakdown (HCIDB) challenges of a new high performance LDMOS generation
저자
by
Schlunder, Christian
;
Heinrigs, Wolfgang
;
Landgraf, Erhard
;
Aresu, Stefano
;
Feick, Henning
, et al.
소스
2014 IEEE International Reliability Physics Symposium Reliability Physics Symposium, 2014 IEEE International. :XT.15.1-XT.15.5 Jun, 2014
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7 . Conference
HCI vs. BTI? - Neither one's out
저자
by
Schlunder, Christian
;
Aresu, Stefano
;
Georgakos, Georg
;
Kanert, Werner
;
Reisinger, Hans
, et al.
소스
2012 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2012 IEEE International. :2F.4.1-2F.4.6 Apr, 2012
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7 . Conference
Physical understanding and modelling of new hot-carrier degradation effect on PLDMOS transistor
저자
by
Aresu, Stefano
;
Vollertsen, Rolf-Peter
;
Rudolf, Ralf
;
Schlunder, Christian
;
Reisinger, Hans
, et al.
소스
2012 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2012 IEEE International. :XT.11.1-XT.11.6 Apr, 2012
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7 . Academic Journal
A Study of NBTI and Short-Term Threshold Hysteresis of Thin Nitrided and Thick Non-Nitrided Oxides.
저자
by
Reisinger, Hans
;
Vollertsen, Rolf-Peter
;
Wagner, Paul-Jürgen
;
Huttner, Thomas
;
Martin, Andreas
, et al.
소스
IEEE Transactions on Device & Materials Reliability; Jun2009, Vol. 9 Issue 2, p106-114, 9p
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7 . Academic Journal
New aspects for lifetime prediction of bipolar transistors in automotive power wafer technologies by using a power law fitting procedure
저자
by
Goroll, Michael
;
Pufall, Reinhard
;
Aresu, Stefano
;
Gustin, Wolfgang
.
소스
Microelectronics Reliability
. Aug2008, Vol. 48 Issue 8/9, p1509-1512. 4p.
Full Text (ScienceDirect)
Scopus
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6 . Academic Journal
Analysis of ESD protection structure behaviour after ageing as new approach for system level reliability of automotive power devices
저자
by
Goroll, Michael
;
Kanert, Werner
;
Pufall, Reinhard
;
Aresu, Stefano
.
소스
Microelectronics Reliability
. Sep2007, Vol. 47 Issue 9-11, p1512-1516. 5p.
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