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1 . Academic Journal
Surface relaxation and photoelectric absorption effects on synchrotron X-ray topographic images of dislocations lying on the basal plane in off-axis 4H-SiC crystals
저자
by
Ailihumaer, Tuerxun
;
Peng, Hongyu
;
Fujie, Fumihiro
;
Raghothamachar, Balaji
;
Dudley, Michael
, et al.
소스
In
Materials Science & Engineering B
September 2021 271
Full Text (ScienceDirect)
Web of Science
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7 . Academic Journal
Synchrotron X-ray topographic image contrast variation of screw-type basal plane dislocations located at different depths below the crystal surface in 4H-SiC
저자
by
Fujie, Fumihiro
;
Peng, Hongyu
;
Ailihumaer, Tuerxun
;
Raghothamachar, Balaji
;
Dudley, Michael
, et al.
소스
In
Acta Materialia
15 April 2021 208
Full Text (ScienceDirect)
Web of Science
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7 . Academic Journal
Synchrotron X-ray topography characterization of high quality ammonothermal-grown gallium nitride substrates
저자
by
Liu, Yafei
;
Raghothamachar, Balaji
;
Peng, Hongyu
;
Ailihumaer, Tuerxun
;
Dudley, Michael
, et al.
소스
In
Journal of Crystal Growth
1 December 2020 551
Full Text (ScienceDirect)
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7 . Academic Journal
X-ray topography characterization of gallium nitride substrates for power device development
저자
by
Raghothamachar, Balaji
;
Liu, Yafei
;
Peng, Hongyu
;
Ailihumaer, Tuerxun
;
Dudley, Michael
, et al.
소스
In
Journal of Crystal Growth
15 August 2020 544
Full Text (ScienceDirect)
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7 . Academic Journal
Characterization of defects and strain in the (AlxGa(1−x))0.5In0.5P/ GaAs system by synchrotron X-ray topography
저자
by
Peng, Hongyu
;
Ailihumaer, Tuerxun
;
Liu, Yafei
;
Raghothamachar, Balaji
;
Dudley, Michael
.
소스
In
Journal of Crystal Growth
1 March 2020 533
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7 . Academic Journal
Dislocation contrast on X‐ray topographs under weak diffraction conditions.
저자
by
Peng, Hongyu
;
Ailihumaer, Tuerxun
;
Liu, Yafei
;
Raghotharmachar, Balaji
;
Huang, Xianrong
, et al.
소스
Journal of Applied Crystallography
. Aug2021, Vol. 54 Issue 4, p1225-1233. 9p.
Scopus
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7 . Academic Journal
Characterization of Dislocations in 6H-SiC Wafer Through X-Ray Topography and Ray-Tracing Simulations.
저자
by
Cheng, Qianyu
;
Ailihumaer, Tuerxun
;
Liu, Yafei
;
Peng, Hongyu
;
Chen, Zeyu
, et al.
소스
Journal of Electronic Materials; Jul2021, Vol. 50 Issue 7, p4104-4117, 14p
Web of Science
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7 . Academic Journal
Characterization of Hazy Morphology on AlInP/GaAs Epitaxial Wafers Grown by Organometallic Vapor-Phase Epitaxy.
저자
by
Peng, Hongyu
;
Ailihumaer, Tuerxun
;
Liu, Yafei
;
Kisslinger, Kim
;
Tong, Xiao
, et al.
소스
Journal of Electronic Materials; Jun2021, Vol. 50 Issue 6, p3006-3012, 7p
Web of Science
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7 . Academic Journal
Synchrotron X-ray Topography Studies of Dislocation Behavior During Early Stages of PVT Growth of 4H-SiC Crystals.
저자
by
Ailihumaer, Tuerxun
;
Peng, Hongyu
;
Liu, Yafei
;
Raghothamachar, Balaji
;
Dudley, Michael
, et al.
소스
Journal of Electronic Materials; Jun2021, Vol. 50 Issue 6, p3258-3265, 8p
Web of Science
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7 . Academic Journal
X-ray Topography Characterization of GaN Substrates Used for Power Electronic Devices.
저자
by
Liu, Yafei
;
Peng, Hongyu
;
Ailihumaer, Tuerxun
;
Raghothamachar, Balaji
;
Dudley, Michael
.
소스
Journal of Electronic Materials; Jun2021, Vol. 50 Issue 6, p2981-2989, 9p
Web of Science
Scopus
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