Phase field simulation of the inclusion instability and splitting processes in interconnects due to interface diffusion induced by electromigration.
- Resource Type
- Journal
- Authors
- Zhou, Linyong (PRC-NAA-MCN) AMS Author Profile; Huang, Peizhen (PRC-NAA-MCN) AMS Author Profile; Zhang, Jiaming (PRC-NAA-MCN) AMS Author Profile
- Source
- Journal of Mechanics of Materials and Structures (J. Mech. Mater. Struct.) (20230101), 18, no.~1, 39-58. ISSN: 1559-3959 (print).
- Subject
- 74 Mechanics of deformable solids -- 74F Coupling of solid mechanics with other effects
74F15 Electromagnetic effects
78 Optics, electromagnetic theory -- 78A General
78A55 Technical applications
- Language
- English