Strain relaxation induced transverse resistivity anomalies in SrRuO3 thin films
- Resource Type
- Journal
- Authors
- Miao, Ludi; Schreiber, Nathaniel J.; Nair, Hari P.; Goodge, Berit H.; Jiang, Shengwei; Ruf, Jacob P.; Lee, Yonghun; Fu, Matthew; Tsang, Boris; Li, Yingfei; Zeledon, Cyrus; Shan, Jie; Mak, Kin Fai; Kourkoutis, Lena F.; Schlom, Darrell G.; Shen, Kyle M.
- Source
- PHYSICAL REVIEW B; AUG 7 2020, 102 6, p064406 6p.
- Subject
- Language
- English
- ISSN
- 24699969