Phase Coexistence near a Morphotropic Phase Boundary in Sm-doped BiFeO3 Films
- Resource Type
- Journal Article
- Authors
- Source
- Applied Physics Letters; 91; 15
- Subject
- 36 MATERIALS SCIENCE BISMUTH COMPOUNDS
CRYSTAL GROWTH
DOPED MATERIALS
EPITAXY
THIN FILMS
PHASE TRANSFORMATIONS
STRAINS
SYNCHROTRON RADIATION
TEMPERATURE RANGE
TEMPERATURE RANGE 0065-0273 K
TEMPERATURE RANGE 0400-1000 K
VOLUME
X-RAY DIFFRACTION
- Language
- English
- ISSN
- 0003-6951
We have investigated heteroepitaxial films of Sm-doped BiFeO{sub 3} with a Sm-concentration near a morphotropic phase boundary. Our high-resolution synchrotron x-ray diffraction, carried out in a temperature range of 25 to 700 C, reveals substantial phase coexistence as one changes temperature to crossover from a low-temperature PbZrO{sub 3}-like phase to a high-temperature orthorhombic phase. We also examine changes due to strain for films exhibiting anisotropic misfit between film and substrate. Additionally, thicker films exhibit a substantial volume collapse associated with the structural transition that is suppressed in thinner films.