EVALUATION OF HOMOGENEOUS AND HETEROGENEOUS METHODS OF ANALYSIS IN A REFLECTED SUBCRITICAL ASSEMBLY.
- Resource Type
- Journal Article
- Authors
- Source
- Nucl. Sci. Eng., 36: 116-22(Apr. 1969).; Other Information: Orig. Receipt Date: 31-DEC-69
- Subject
- N38510* --Research & Test Reactors & Critical Assemblies-- Kinetics & Dynamics ANALYSIS
BUCKLING
CRITICALITY
DISTRIBUTION
ERRORS
EXPONENTIAL PILES
HOMOGENEOUS
MEASUREMENT
NEUTRON FLUX
REFLECTORS EXPONENTIAL PILES/criticality parameters in reflected, homogeneous and heterogeneous methods for analysis of, (E/T)
CRITICALITY/ parameters in reflected subcritical assemblies, homogeneous and heterogeneous methods for analysis of, (E/T)
EXPONENTIAL PILES/criticality parameters in reflected, homogeneous and heterogeneous methods for analysis of, (E/T)
- Language
- English