Nanoscale measurements of the work function in nanocrystalline TiN and amorphous films by multimode scanning probe microscopy and spectroscopy
- Resource Type
- Journal Article
- Source
- JSAP Annual Meetings Extended Abstracts. 2015, :1379
- Subject
12p-D8-2 nitride scanning tunneling spectroscopy work function 新材料・新技術・評価手法など 薄膜・表面 薄膜新材料 - Language
- English
- ISSN
- 2436-7613