Photocarrier Buildup Effects in Si Nanostripes Measured by Scanning Probe Microscopy
- Resource Type
- Journal Article
- Source
- JSAP Annual Meetings Extended Abstracts. 2013, :3441
- Subject
20a-C9-6 フォトキャリヤー 半導体 半導体A(シリコン) 基礎物性・評価 プローブ顕微鏡 - Language
- English
- ISSN
- 2436-7613