Detection of Perpendicular Recording Bit Using Force Microscopy for High Density Magnetic Recording
- Resource Type
- Journal Article
- Authors
- Junichi KISHIGAMI; Keiichi YANAGISAWA; Reizo KANEKO; Toshifumi OHKUBO
- Source
- Journal of the Magnetics Society of Japan. 1991, 15(S_2_PMRC_91)469
- Subject
- Language
- English
- ISSN
- 0285-0192
1880-4004
For investigation of perpendicular recording mechanism, the magnetic force microscope (MFM) has been developed, with advantages of non-contact and non-destructive detection in air. The AC method was used for magnetic field detection. Micro-magnetic tip and cantilever were formed as a monoblock by sputtered deposition. The MFM has detected the force gradient caused by a double-layered perpendicular medium having periodic recorded patterns written by a ring-type thin-film head with different recording densities. Recorded bits of densities up to 2500 fr/mm (62.5 KFCI) have been detected. These MFM images correlated with the results of the Bitter and polarizing microscopy. Comparison of a recorded bit on a longitudinal medium revealed a distinct difference from the perpendicular medium.