High resolution in situ Li depth profiling of thin films stacked Li ion batteries under charging conditions by means of TERD and RBS techniques with 5 MeV He+2 ion beam
- Resource Type
- Article
- Source
- In
Nuclear Inst. and Methods in Physics Research, B 15 December 2018 437:8-12 - Subject
- Language
- ISSN
- 0168-583X