Dislocation dynamics and slip band formation in silicon: In-situ study by X-ray diffraction imaging
- Resource Type
- Article
- Authors
- Danilewsky, A.N.; Wittge, J.; Croell, A.; Allen, D.; McNally, P.; Vagovič, P.; dos Santos Rolo, T.; Li, Z.; Baumbach, T.; Gorostegui-Colinas, E.; Garagorri, J.; Elizalde, M.R.; Fossati, M.C.; Bowen, D.K.; Tanner, B.K.
- Source
- In Journal of Crystal Growth 1 March 2011 318(1):1157-1163
- Subject
- Language
- ISSN
- 0022-0248