Application of a novel test system to characterize single-event effects at cryogenic temperatures
- Resource Type
- Article
- Authors
- Ramachandran, Vishwanath; Gadlage, Matthew J.; Ahlbin, Jonathan R.; Narasimham, Balaji; Alles, Michael L.; Reed, Robert A.; Bhuva, Bharat L.; Massengill, Lloyd W.; Black, Jeffrey D.; Foster, Christopher N.
- Source
- In Solid State Electronics 2010 54(10):1052-1059
- Subject
- Language
- ISSN
- 0038-1101