A comparative study on single event irradiation effects between Trench MOSFET and Split-gate-trench MOSFET
- Resource Type
- Conference
- Authors
- Ren, Min; Wu, Yining; Yu, Shiheng; Lai, Xinzhang; Zhuo, Ningze; Li, Zehong; Zhang, Bo
- Source
- 2022 IEEE 16th International Conference on Solid-State & Integrated Circuit Technology (ICSICT) Solid-State & Integrated Circuit Technology (ICSICT), 2022 IEEE 16th International Conference on. :1-3 Oct, 2022
- Subject
- Components, Circuits, Devices and Systems
Integrated circuit technology
MOSFET
Radiation effects
Split gate flash memory cells
Logic gates
Periodic structures
- Language
The single event effects of conventional Trench MOSFET (T-MOS) and Split-gate-trench MOSFET (SGT-MOS) with the same breakdown voltage are compared in this paper by simulation. It is shown that the sensitive positions and failure process of single event burnout (SEB) and single event gate rupture (SEGR) are different for T-MOS and SGT-MOS. Compared with T-MOS, SGT-MOS has better anti single event effect ability.