Cell-Aware Test on Various Circuits in an Advanced 3-nm Technology
- Resource Type
- Periodical
- Authors
- Gao, Z.; Hu, M.; Baert, R.; Chehab, B.; Swenton, J.; Malagi, S.; Huisken, J.; Goossens, K.; Marinissen, E.J.
- Source
- IEEE Design & Test IEEE Des. Test Design & Test, IEEE. 41(2):56-64 Apr, 2024
- Subject
- Computing and Processing
Components, Circuits, Devices and Systems
Circuit faults
Metals
FinFETs
Standards
Logic gates
Transistors
Test pattern generators
Quality control
Cellular networks
Testing
Performance evaluation
Manufacturing processes
Microelectronics
- Language
- ISSN
- 2168-2356
2168-2364
This article describes a method to improve test quality by explicitly targeting realistic cell-internal open and short defects through dedicated technology cell-level test patterns. The authors report some of the earliest results of their cell-aware test methods on an advanced 3-nm technology library from IMEC.