An On-Chip Digital Environment Monitor for Field Test
- Resource Type
- Conference
- Authors
- Kajihara, Seiji; Miyake, Yousuke; Sato, Yasuo; Miura, Yukiya
- Source
- 2014 IEEE 23rd Asian Test Symposium Test Symposium (ATS), 2014 IEEE 23rd Asian. :254-257 Nov, 2014
- Subject
- Components, Circuits, Devices and Systems
Computing and Processing
Temperature measurement
Temperature sensors
Oscillators
Voltage measurement
Estimation
Monitoring
Aging
temperature and voltage monitor
ring oscillator
field test
- Language
- ISSN
- 1081-7735
2377-5386
An on-chip environment monitor that can estimate a chip temperature and a power supply voltage has been developed to assist accurate circuit delay measurement by field test. The monitor consists of digital circuits and satisfies several features desired for the field test. This paper describes the architecture of the monitor and how to estimate the temperature and voltage in field, and finally shows simulation and TEG results on estimation accuracy.