Measurement of Dielectric Properties and Reflection Loss for Low-Loss Substrates and Conductors in Millimeter-Wave Ranges
- Resource Type
- Conference
- Authors
- Xu, Hao; Liang, Weijun; Han, Yutong; Jia, Chao; Yang, Ruonan
- Source
- 2023 Cross Strait Radio Science and Wireless Technology Conference (CSRSWTC) Cross Strait Radio Science and Wireless Technology Conference (CSRSWTC), 2023. :01-03 Nov, 2023
- Subject
- Computing and Processing
Fields, Waves and Electromagnetics
Photonics and Electrooptics
Signal Processing and Analysis
Permittivity measurement
Millimeter wave measurements
Millimeter wave technology
Dielectric loss measurement
Conductors
Loss measurement
Reflection
millimeter-wave
open resonator
dielectric
reflection loss
- Language
- ISSN
- 2377-8512
In this paper, electromagnetic characterization techniques for dielectric substrates and conductors in millimeter-wave ranges are studied. A quasi-optical Fabry-Perot open resonator (FPOR) is developed to measure the complex permittivity of low-loss materials and the reflection loss of metal samples non-destructively at (20~67) GHz. The FPOR supports accurate measurements for both the electrically thin and thick samples owing to that the double-concave and the plano-concave operation mode can be switched easily in the same apparatus.