Embedded powerPC 405 & 440-based SoC product qualifications on 45°-rotated substrates
- Resource Type
- Conference
- Authors
- Nsame, Pascal; Tang, George; Viau, Ernie; Outama, Khambay; Nigussie, Teddy; Dunston, Claude; Sziklas, Edward; Goth, George; Graas, Carole
- Source
- 2009 IEEE International Reliability Physics Symposium Reliability Physics Symposium, 2009 IEEE International. :579-584 Apr, 2009
- Subject
- General Topics for Engineers
Qualifications
Dielectric substrates
CMOS technology
Power system reliability
Tensile stress
Compressive stress
Delay
Random access memory
Packaging
Testing
- Language
- ISSN
- 1541-7026
1938-1891
We discuss functionality, performance, power and reliability evaluations of the world's first SoC products fabricated using IBM 90nm technology on a 45°-rotated substrate. We have demonstrated reliable product operational lifetimes with up to 12% improved across die delay variability including 30% product performance improvement and 33% leakage reduction over nonrotated substrate.