Board-level Functional Test Selection Based on Fault Tree Analysis
- Resource Type
- Conference
- Authors
- Li, Yaoyao; Wang, Kangcheng; Kang, Yu; Zhao, Yunbo; Bai, Peng
- Source
- 2023 6th International Symposium on Autonomous Systems (ISAS) Autonomous Systems (ISAS), 2023 6th International Symposium on. :1-6 Jun, 2023
- Subject
- Aerospace
Robotics and Control Systems
Transportation
Costs
Autonomous systems
Printed circuits
Reliability engineering
Complexity theory
Circuit faults
Fault trees
intelligent manufacturing
board-level functional test
test selection
fault tree analysis
- Language
With the increasing complexity of the circuit board, the cost of the board-level functional test becomes dramatically high. Data-driven-based test selection methods have been widely studied for test-cost reduction. However, existing test selection methods tend to overfit due to overlooking the root causes of faulty boards. To address this issue, a test selection method based on fault tree analysis is proposed. A fault tree oriented to the board-level functional test is established for analyzing the reliability of the board and test items. The reliability analysis result is then utilized to design a test strategy. Three indices are introduced to evaluate the test efficiency and the test quality. Experimental results demonstrate the effectiveness of the proposed method.