Neutron-induced single event burnout in high voltage electronics
- Resource Type
- Periodical
- Authors
- Normand, E.; Wert, J.L.; Oberg, D.L.; Majewski, P.R.; Voss, P.; Wender, S.A.
- Source
- IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 44(6):2358-2366 Dec, 1997
- Subject
- Nuclear Engineering
Bioengineering
Voltage
Neutrons
MOSFETs
Concrete
Laboratories
Protons
Nondestructive testing
Attenuation
Semiconductor diodes
Thyristors
- Language
- ISSN
- 0018-9499
1558-1578
Energetic neutrons with an atmospheric neutron spectrum, which were demonstrated to induce single event burnout in power MOSFETs, have been shown to induce burnout in high voltage (>3000 V) electronics when operated at voltages as low as 50% of rated voltage. The laboratory failure rates correlate well with field failure rates measured in Europe.