Redundancy Effect on Electromigration Failure Time in Power Grid Networks
- Resource Type
- Conference
- Authors
- Lin, M. H.; Lin, C. I.; Wang, Y. C.; Wang, Aaron
- Source
- 2022 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2022 IEEE International. :1-7 Mar, 2022
- Subject
- Components, Circuits, Devices and Systems
Engineered Materials, Dielectrics and Plasmas
Engineering Profession
Degradation
Ring oscillators
Mesh networks
Time-frequency analysis
Monte Carlo methods
Delay effects
Redundancy
Electromigration
Power Grid networks
Cu interconnect
Monte-Carlo simulation
- Language
- ISSN
- 1938-1891
We characterize the redundancy effect on EM failure time in power grid networks and propose a flow to leverage the benefit of the redundancy effect on EDA tools. Experimental results fit Monte-Carlo simulation based on a parallel model incorporating time-dependent stress loading. Ring oscillator frequency degradation and clock tree time delay are also evaluated on simplified power mesh networks as EM voids occur. A simple and practical EM check algorithm for EDA tools that takes the benefit of the redundancy effect on power grid networks into account is proposed.