SEL and TID Test Results on a Radiation Hardened Bus Switch Family
- Resource Type
- Conference
- Authors
- Von Thun, Matt; Sapp, Scott; Walz, Dale; Anderson, Rex; Farris, Teresa
- Source
- 2016 IEEE Radiation Effects Data Workshop (REDW) Radiation Effects Data Workshop (REDW), 2016 IEEE. :1-5 2016
- Subject
- Aerospace
Components, Circuits, Devices and Systems
Photonics and Electrooptics
Switches
Radiation effects
Testing
Springs
Ions
Field programmable gate arrays
- Language
The SEL and TID test results are presented for the Cobham radiation hardened bus switch family of products. The device is SEL immune to an effective LET ≤ 100 MeV·cm2/mg and TID qualified to 300krad(Si).