Speed binning with path delay test in 150-nm technology
- Resource Type
- Periodical
- Authors
- Cory, B.D.; Kapur, R.; Underwood, B.
- Source
- IEEE Design & Test of Computers IEEE Des. Test. Comput. Design & Test of Computers, IEEE. 20(5):41-45 Jan, 2003
- Subject
- Computing and Processing
Delay
Timing
Frequency
Automatic test pattern generation
System testing
Engines
Performance evaluation
Robustness
Voltage control
Temperature
- Language
- ISSN
- 0740-7475
1558-1918
What would it take to reduce speed binning's dependency on functional testing? One answer is a structural at-speed test approach that can achieve the same effectiveness as functional testing. The authors of this article offer a formula to relate structural critical-path testing frequency to system operation frequency. They demonstrate that there can be a high correlation between frequencies resulting from structural testing and those resulting from functional testing.