Radiation Effects Characterization of an Arm®-Based 32-bit Microcontroller
- Resource Type
- Conference
- Authors
- Wilson, Anthony; Von Thun, Matt; Baranski, Brian; Anderson, Rex; Turnbull, Aaron
- Source
- 2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018) Nuclear & Space Radiation Effects Conference (NSREC 2018), 2018 IEEE. :1-7 Jul, 2018
- Subject
- Aerospace
Components, Circuits, Devices and Systems
Nuclear Engineering
Photonics and Electrooptics
Microcontrollers
Random access memory
Single event upsets
Radiation effects
Registers
Springs
- Language
- ISSN
- 2154-0535
Single event effects and total ionizing dose test data on the newly designed and fabricated Cobham radiation-hardened UT32M0R500 ARM® Cortex™-M0+ 32-bit based micro-controller will be presented.