Benchmarking of a surface potential based organic thin-film transistor model against C10-DNTT high performance test devices
- Resource Type
- Conference
- Authors
- Maiti, T. K.; Hayashi, T.; Mori, H.; Kang, M. J.; Takimiya, K.; Miura-Mattausch, M.; Mattausch, H. J.
- Source
- 2013 IEEE International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2013 IEEE International Conference on. :157-161 Mar, 2013
- Subject
- Components, Circuits, Devices and Systems
Computing and Processing
Engineered Materials, Dielectrics and Plasmas
Organic thin film transistors
Integrated circuit modeling
Organic semiconductors
Logic gates
Mathematical model
Semiconductor process modeling
Organic Thin-Film Transistors
surface potential
traps
compact model
- Language
- ISSN
- 1071-9032
In this paper, a surface potential based compact model for organic thin-film transistors (OTFTs) including both tail and deep trap states across the band gap is presented and benchmarked against measured data from high-performance dinaphtho thieno thiophene (C 10 -DNTT) based test devices. This model can accurately describe the OTFT test-structure current from week to strong inversion regime.