A fully automated RF measurement system enabling statistical analysis on 22nm FDSOI
- Resource Type
- Conference
- Authors
- Juettner, Maximilian; Seiler, Tim; Pirro, Luca; Otto, Michael; Hoentschel, Jan; Klix, Wilfried; Stenzel, Roland
- Source
- 2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) Ultimate Integration on Silicon (EUROSOI-ULIS), 2019 Joint International EUROSOI Workshop and International Conference on. :1-4 Apr, 2019
- Subject
- Components, Circuits, Devices and Systems
Signal Processing and Analysis
RF
fT
Imax
parameter extraction
Monte-Carlo-Simulation CMOS
FDSOI
- Language
- ISSN
- 2472-9132
A new test methodology for the transit frequency f T and the maximum oscillation frequency I max has been developed. The novel measurement setup is optimized for high volume extraction enabling statistical analysis of both f T and I max in a small time frame. The functionality of this setup has been tested on advanced FDSOI transistors. Additionally, Monte-Carlo-Simulations were employed to evaluate the upper and lower boundaries for potential measurement errors.