The physics of NBTI: What do we really know?
- Resource Type
- Conference
- Authors
- Stathis, James H.
- Source
- 2018 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2018 IEEE International. :2A.1-1-2A.1-4 Mar, 2018
- Subject
- Components, Circuits, Devices and Systems
Computing and Processing
Engineered Materials, Dielectrics and Plasmas
Engineering Profession
Stress
Negative bias temperature instability
Thermal variables control
Data models
Interface states
Silicon
Logic gates
interface states
oxide traps
NBTI
- Language
- ISSN
- 1938-1891
There is no consensus on the basic physical mechanism of Negative Bias Temperature Instability, in spite of thousands of publications over the past half century. There remains fundamental disagreement over whether NBTI is diffusion-limited or reaction-limited. The origins of the two viewpoints are summarized and some comments on the main controversial aspects of the two leading models are offered.