Internal photoemission in Ag-Al2O3-Al junctions
- Resource Type
- Periodical
- Authors
- Guedes, J.; Slayman, C.; Gustafson, T.; Jain, R.
- Source
- IEEE Journal of Quantum Electronics IEEE J. Quantum Electron. Quantum Electronics, IEEE Journal of. 15(6):475-481 Jun, 1979
- Subject
- Engineered Materials, Dielectrics and Plasmas
Photonics and Electrooptics
Photoelectricity
Charge carrier processes
Energy measurement
Photoconductivity
Area measurement
Current measurement
Charge measurement
Q measurement
Position measurement
Thickness measurement
- Language
- ISSN
- 0018-9197
1558-1713
We report a detailed study of the magnitude of the photon-induced current in Ag-Al 2 O 3 -Al metal-oxide-metal junctions as a function of photon energy and angle of incident radiation. Experimental observations and a theory based on vacuum photoemission are found to be in good agreement. Fast risetimes (\lsim50ns) and linearity of the photocurrent with respect to incident power up to at least 10 kW/cm 2 are also reported.