Time-resolved ion beam induced charge collection (TRIBICC) in micro-electronics
- Resource Type
- Periodical
- Authors
- Schone, H.; Walsh, D.S.; Sexton, F.W.; Doyle, B.L.; Dodd, P.E.; Aurand, J.F.; Flores, R.S.; Wing, N.
- Source
- IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 45(6):2544-2549 Dec, 1998
- Subject
- Nuclear Engineering
Bioengineering
Ion beams
Current measurement
Bandwidth
Power system transients
Charge measurement
Particle measurements
Laboratories
Testing
Shape measurement
Transmission line measurements
- Language
- ISSN
- 0018-9499
1558-1578
The entire current transient induced by single 12-MeV Carbon ions was measured at a 5 GHz analog bandwidth. A focused ion micro-beam was used to acquire multiple single ion transients at multiple locations of a single CMOS transistor. The current transients reveal clear and discernible contributions of drift and diffusive charge collection. Transients measured for drain and off-drain ion strikes compare well to 3D DAVINCI calculations. The simulations match the drift charge collection measurements within experimental errors. Estimates are presented for the drift assisted funneling charge collection depth.