Integrated-Circuit Node for Time-Domain Near-infrared Diffuse Optical Tomography Imaging Arrays with On-chip Histogramming and Integrated VCSELs
- Resource Type
- Conference
- Authors
- Moazeni, Sajjad; Renehan, Kevin; Pollmann, Eric H.; Shepard, Kenneth L.
- Source
- 2021 IEEE Custom Integrated Circuits Conference (CICC) Custom Integrated Circuits Conference (CICC), 2021 IEEE. :1-2 Apr, 2021
- Subject
- Components, Circuits, Devices and Systems
Neural activity
Tomography
Functional magnetic resonance imaging
Optical imaging
System-on-chip
Optical scattering
Optical sensors
- Language
- ISSN
- 2152-3630
Next-generation brain-computer interfaces (BCI) for healthy individuals largely rely on non-invasive functional imaging methods to record cortex-wide neural activity because of the risk associated with surgically implanted devices. Near-infrared (NIR) time-domain diffuse optical tomography (TD-DOT) is a promising non-invasive imaging approach which relies on reduced optical scattering and absorption of the human skull and brain tissue in the NIR spectrum [1]. In TD-DOT imaging, the time-of-flight (ToF) of scattered photons is measured, improving on continuous-wave approaches. This method has the potential to allow for direct sensing of intracellular neural activity and hemodynamics at higher spatial resolutions than electroencephalogram (EEG) and at higher temporal resolution than functional magnetic resonance imaging (fMRI), while supporting more compact and cost-effective form factors.